Micromanipulator has been working with and learning from our customers since 1956, a partner in their success. We have extensive experience in leading edge applications ranging from low current, to high speed testing. Our areas of expertise include:
- Low current / low noise measurement
- Failure Analysis
- High and low temperature characterization
- Device reliability analysis – Interconnect, EM, HCI, Charge Pumping, NBTI, PBTI, TDDB,
- High speed digital analysis
- High frequency up to 200GHz
- C-V measurements
- Sub-micron probing
- ESD wafer level testing
- Laser cutting
- High power device analysis
Need more information? We can help. Talk to Engineer about your application.
- Micromanipulator Application Note – CV Probing
- Micromanipulator Application Note – Idenifing Low Current Probing Problems
- Micromanipulator Application Note – LCR Measurements With 4284A
- Micromanipulator Application Note – Low Current Probing Basics
- Micromanipulator Application Note – LTE and Vibration Isolation Table Integration
- Micromanipulator Application Note – Proven Techniques for Thermal Probing
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