Application Notes

Micromanipulator has been working with and learning from our customers since 1956, a partner in their success.  We have extensive experience in leading edge applications ranging from low current, to high speed testing.  Our areas of expertise include:

  • Low current / low noise measurement
  • Failure Analysis
  • High and low temperature characterization
  • Device reliability analysis – Interconnect, EM, HCI, Charge Pumping, NBTI, PBTI, TDDB,
  • High speed digital analysis
  • High frequency up to 200GHz
  • C-V measurements
  • Sub-micron probing
  • ESD wafer level testing
  • Laser cutting
  • High power device analysis

Need more information?  We can help.  Talk to Engineer about your application.


Wafer Probes

Wafer Chuck

Hot Chuck

Needle Probes

Wafer Probers