Micromanipulator Probe Stations

The Micromanipulator Company offers the semiconductor industry one of the most comprehensive range of probe stations on the market. The wide selection is designed to meet the needs of most wafer testing applications. Our quality probe stations come in Specialty, Semi-automatic, High-performance, General-purpose Manual, and Economy Manual models. In addition we have available all of the consumables, accessories and on-site support you require.

Contact us to learn more about how you can finance the probe station you need.

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VERSA Double Sided Probe System
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Front, Micromanipulator Probe Stations
- Worlds most versatile probe station
- Double sided probing and imaging
- Probe decapsulated IC’s, wafers, and large boards up to 26″ square, all at temperature.
- -40C to 125C configurable
- Integrated vibration isolation platform
- Magnetic field options
- Patented
- Integration with popular high-resolution emission microscope to pinpoints failure locations, top down and DSP, with temperature too!
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VERSA Modular Probe System
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Micromanipulator Probe Stations
- Based on the world’s most versatile probe system
- Customized thermal options – Hot & Cold (frost free)
- Integrated vibration isolation platform
- Modular designed allows for all device testing such as:
- Backside & Double Sided.
- High-speed signal acquisition.
- Use as an optical inspection platform.
- High-power, DC, high frequency, & mmW.
- Test wafers, boards, pieces, packaged parts, & individual die, all at temperature.
- Integration with popular high-resolution emission microscope to pinpoints failure locations, top down and DSP, with temperature too!
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P200L Semi-Automatic Probe Station
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Micromanipulator Probe Stations
- 200mm semiautomatic wafer prober
- Optional NETPROBE-7 control software with wafer map, integrated video, theta alignment, sub-die, and pattern recognition
- Drivers available for popular testers companies including Keysight, Keithley, and LabVIEW
- Configurable for DC, RF, Microwave, and High Power applications
- -65C to 400C configurable
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P300L Semi-Automatic Probe Station
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Front, Micromanipulator Probe Stations
- 300mm semiautomatic wafer prober
- NETPROBE-7 control software included (wafer map, sub-die, video, theta alignment, pattern recognition)
- Drivers for popular testers from companies like Keysight and Keithley
- Configurable for DC, RF, Microwave, and High Power applications
- -55C to 300C configurable
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P300J Motorized Manual Probe Station
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Micromanipulator Probe Stations
- 300mm manual wafer prober
- Joystick control
- Exclusive “Microtouch” motorized controls
- Configurable for DC, RF, Microwave, and High Power applications
- -55C to 300C configurable
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P300A Semi-Automatic Probe Station
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Micromanipulator Probe Stations
- Most advanced 300mm semiautomatic wafer prober
- NETPROBE-7 control software included
- Drivers from popular tester companies including Keysight, Keithley, and LabVIEW
- Configurable for DC, RF, Microwave, and High Power applications
- -55C to 300C configurable
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8060 Manual Probe Station
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Micromanipulator Probe Stations
- Highest Performance Manual 150mm-200mm Wafer Prober
- Sub-micron positioning & true single point ground
- One handed platen and microscope quick lift
- Configurable for DC, RF, Microwave, and High Power applications
- -65C to 400C configurable
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4060 Manual Probe Station
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Micromanipulator Probe Stations
- Efficient Manual 150mm-200mm Wafer Prober
- One handed platen lift for efficient sample changes
- Microscope lift and lock
- Configurable for DC, RF, Microwave, and High Power applications
- -65C to 400C configurable
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450PM Manual Probe Station
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Micromanipulator Probe Stations
- Upgradeable Manual 150mm-200mm Wafer Prober
- Configurable for DC, RF, Microwave, and High Power applications
- Ambient to 400C configurable
- Designed to grow with your application
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Probe Stations, Consumables, Accessories and Support

When you buy a wafer probe station from Micromanipulator you are also getting our over 60 years of collective experience in the field of analytical probing. This means that every one of our customers benefit from our “Full Life-Cycle Support,” which starts from concept, to production, right through to maintenance.

The concept stage starts with our exceptional team of experienced engineers who design, develop and manufacture probe stations that offer innovative features not found in other manufacturers’ products. One example is our top-of-the-line, 2210-LS System Level Probe Station that is the world’s first true system-level probe station with above and below ambient temperature capabilities.

Micromanipulator’s consumables are part of our life-cycle and include passive probe holders, active probe holders, high frequency probe holders and probe tips. We recognize that choosing the right accessories for a application is critical so we strive to offer the best selection of accessories on the market today. Whether it is personal preference, measurement equipment interface requirements, application demands or budget needs, you will find it at Micromanipulator.

Finally Micromanipulator’s Full Life-Cycle Support includes receiving a top-quality on-site technical support team. In addition to on site support, our engineers are available to answer questions about our probe stations and accessories and to help determine the best products for your needs.

For more information:

RF Probe Station

Wafer Probers

Wafer Probe Station

Micromanipulator not only invented analytical probing in 1956 but we are the leading name in the field. As such we reliably deliver the tools and life cycle support the semiconductor industry depends on. Part of our company’s philosophy and what drives our success is an unfaltering commitment to our customers’ satisfaction.

Micromanipulator Probe Stations

VERSA Double Sided Probe System

VERSA Modular Probe System

P200L Semi-Automatic Probe Station

P300L Semi-Automatic Probe Station

P300J Motorized Manual Probe Station

P300A Semi-Automatic Probe Station

8060 Manual Probe Station

4060 Manual Probe Station

450PM Manual Probe Station

System Control

System

System Capability

Manipulator Type

Probe Holder Type

Value Considerations

Thermal Chuck Type

Probe Tip Type