P300J Motorized Manual Probe Station

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  • 300mm manual wafer prober
  • Joystick control
  • Exclusive “Microtouch” motorized controls
  • Configurable for DC, RF, Microwave, and High Power applications
  • -55C to 300C configurable


The Micromanipulator P300J 300mm probe station is the most stable, intuitive, and space efficient manual 300mm analytical probe station available today. Designed for low current, sub-micron positioning applications, the P300J comes standard with features such as single-point ground, dry/dark environment, and integrated thermal chuck plumbing. Motorized controls placed conveniently at the front of the station give a dynamic speed range which allows both precise positioning and long-distance moves.

Both joystick and MicroTouchTM controls intuitively operate the station stage, platen (Z), and theta as well as the microscope X-Y and Z drives.  The P300J’s large magnetic stainless steel platen has plenty of room for multiple manipulators and/or a probe card.

The system supports a wide choice of options, and is even backward compatible with accessories (manipulators, probe holders, probe card holders) from our industry-standard 4000 and 8000 series (200mm) stations.

The station includes an adjustable microscope lift delay which prevents driving the probes into the microscope objective, a feature that Micromanipulator pioneered, and which is a hallmark of our professional probing systems.

The P300J may be configured for thermal applications, including our Micromanipulator’s “Top Hat” for low level, frost free below ambient testing.  Three temperature ranges are supported:

  • Ambient (room temperature) to 300C
  • 0C to 300C
  • -55C to 300C

The P300J is the platform of choice for companies who need to probe whole 300mm wafers, but don’t require a semiautomatic probe station for large volume tests.

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