Probe Holders

Micromanipulator offers the most comprehensive line up of probe holders available on the market today. Our products address applications ranging from general purpose DC characterization, high speed, wide bandwidth, to low current and high power. We design, test and manufacture a wide range of high-quality probe holders to meet our customers’ personal preferences, measurement equipment interface requirements or application demands as well as budget.

Product Documentation: Probe Tips and Probe Holder Reference Manual

Probe Holders

Model Application
Model 44
  • High frequency
  • Low level signal testing.
  • 50-ohm circuit testing
  • CV testing
  • Kelvin force and sense and single wire configurations
Model 72
  • Bendable to accommodate custom setup needs.
  • General purpose DC measurement and bias
  • Ideal for use with probe cards or application boards
Model 75 General purpose DC measurement and bias
Model 79 Coaxial
  • High frequency
  • Low level signal testing.
  • CV testing
  • Kelvin force and sense and single wire configurations
Model 79 Triaxial
  • Optimized for low current, fA level measurements
  • Kelvin force and sense and single wire configurations
High Frequency
  • Coplanar configurations (GSG, SG,GS)
  • >1GHZ VNA measurements
Active
  • High input impedance
  • Low input capacitance
  • Fast timing acquisition (optimized rise/fall times)
  • Low capacitance
High/Low Temperature
  • Available in model 79 coaxial, or 79 triaxial configurations
  • >140C or <0C test temperatures
High Power
  • Power device analysis
  • High Current
  • High Voltage
Low Profile
  • Low profile on-axis tip insertion
  • High magnification imaging (reduced optic working distance)
  • Customer setups
  • Application Board
  • Available in model 79 models

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